
NCL – Nano-Characterization Lab
Facility
Images


Electron Microscopy
X-ray diffraction Facility
Spectroscopic Ellipsometry
Scanning Probe Microscopy
Institutional Contacts / Head of Facilities
PL
Provisional Contacts
CERCA Institutes

Castelldefels, Spain
2022
Institut de Ciències Fotòniques (ICFO)
Owners
ICFO
Equipments & Services Offered
Available techniques Electron Microscopy: The facility offers a state-of-art electron microscopy suite with currently 2 SEMs one offering Ultra-high resolution at high and low beam energies for surface sensitive samples. X-ray diffraction Facility: NCL also has An X-ray diffraction facility for powder and thin film measurements, featuring also X-ray reflection for thin film measurements. Spectroscopic Ellipsometry: NCL’s spectroscopic ellipsometry covering a very broad spectral range from 300 nm – 20 μm, provides unprecedented information on the optical properties of materials and photonic structures at such a broad range. Scanning Probe Microscopy: NCL provides several state-of-art scanning probe microscopy systems offering several techniques including AFM, (photo-)conductive AFM, Kelvin-probe AFM, scanning-CAP AFM etc.
Categorització
RIS3CAT domains & other
Industrial System
Educational and knowledge generation System
Energy and resources System
TECHNOLOGICAL EQUIPMENT
Microscopy
Other specializated laboratories
GINYS-ICFO-005
Access procedure & Fares
Open. In order to request access, detailed information on the available equipments and fees, please contact: gerasimos.konstantatos@icfo.eu; johann.osmond@icfo.eu
Medium
Institutional Quality