
Microscopy characterization
Facility
Images




Institutional Contacts / Head of Facilities
IO
Provisional Contacts
CERCA Institutes

Barcelona, Spain
2005
Institut de Bioenginyeria de Catalunya (IBEC)
Owners
IBEC
Equipments & Services Offered
Zeiss confocal microscope, LSM800 Nikon optical microscope, Eclipse L150 Nikon STORM optical microscope, N-STORM Eclipse Ti2-E Scanning electron microscope (SEM) FEI, NovaNanoSEM 230 Leica critical point drying equipment, CPD300 Auto Leybold gold sputtering equipment, Univex 450B
Training in techniques, equipment and processes of Optical and Electronic Microscopy for autonomous use (self-user mode). Customized Optical and Electron Microscopy Services, conducted by scientific personnel (order mode with previous quotation). Confocal and fluorescence sample characterization Morphological and topographic characterization by scanning electron microscopy (SEM) High vacuum mode (conductive samples) Low vacuum mode (insulating samples, or not compatible with high vacuum) Combined topographic (SEM) and fluorescence (Confocal) sample characterization SEM sample preparation Chemical fixation service for biological samples Critical point dehydration service Gold coating service for high resolution inspection of insulating samples STORM Microscopy: Single molecule localization and particle tracking.
Categorització
RIS3CAT domains & other
Social and Health System
Industrial System
Educational and knowledge generation System
TECHNOLOGICAL EQUIPMENT
Microscopy
GINYS-IBEC-002
Access procedure & Fares
Institutional Quality